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<article article-type="research-article" dtd-version="1.3" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xml:lang="ru"><front><journal-meta><journal-id journal-id-type="publisher-id">ipolytech</journal-id><journal-title-group><journal-title xml:lang="ru">iPolytech Journal</journal-title><trans-title-group xml:lang="en"><trans-title>iPolytech Journal</trans-title></trans-title-group></journal-title-group><issn pub-type="ppub">2782-4004</issn><issn pub-type="epub">2782-6341</issn><publisher><publisher-name>Irkutsk National Research Technical University</publisher-name></publisher></journal-meta><article-meta><article-id pub-id-type="doi">10.21285/1814-3520-2025-4-453-465</article-id><article-id custom-type="edn" pub-id-type="custom">VKAJSF</article-id><article-id custom-type="elpub" pub-id-type="custom">ipolytech-986</article-id><article-categories><subj-group subj-group-type="heading"><subject>Research Article</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="ru"><subject>МАШИНОСТРОЕНИЕ</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="en"><subject>MECHANICAL ENGINEERING</subject></subj-group></article-categories><title-group><article-title>Исследование влияния режимов сканирования на точность результатов и производительность процесса при контроле деталей сложной формы</article-title><trans-title-group xml:lang="en"><trans-title>Accuracy and process performance in the inspection of complex geometry as a function of scanning parameters</trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author" corresp="yes"><contrib-id contrib-id-type="orcid">https://orcid.org/0000-0001-8068-0023</contrib-id><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Корж</surname><given-names>М. А.</given-names></name><name name-style="western" xml:lang="en"><surname>Korzh</surname><given-names>M. A.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Корж Максим Андреевич, аспирант</p><p>664074, г. Иркутск, ул. Лермонтова, 83</p><p> </p></bio><bio xml:lang="en"><p>Maksim A. Korzh, Postgraduate Student</p><p>83 Lermontov St., Irkutsk 664074</p></bio><email xlink:type="simple">korzhma@ex.istu.edu</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><contrib-id contrib-id-type="orcid">https://orcid.org/0000-0001-7814-0431</contrib-id><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Перелыгина</surname><given-names>А. Ю.</given-names></name><name name-style="western" xml:lang="en"><surname>Perelygina</surname><given-names>A. Yu.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Перелыгина Александра Юрьевна, к.т.н., доцент,заведующий кафедрой инженерной и компьютерной графики</p><p>664074, г. Иркутск, ул. Лермонтова, 83</p></bio><bio xml:lang="en"><p>Aleksandra Yu. Perelygina, Cand. Sci. (Eng.), Associate Professor, Head of the Department of Engineering and Computer Graphics</p><p>83 Lermontov St., Irkutsk 664074</p></bio><email xlink:type="simple">perelygina@istu.edu</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><contrib-id contrib-id-type="orcid">https://orcid.org/0000-0003-2028-4162</contrib-id><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Савилов</surname><given-names>А. В.</given-names></name><name name-style="western" xml:lang="en"><surname>Savilov</surname><given-names>A. V.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Савилов Андрей Владиславович, к.т.н., доцент,доцент кафедры технологии и оборудования машиностроительных производств</p><p>664074, г. Иркутск, ул. Лермонтова, 83</p></bio><bio xml:lang="en"><p>Andrey V. Savilov, Cand. Sci. (Eng.), Associate Professor,Associate Professor of the Department of Mechanical Engineering Production Technologies and Equipment</p><p>83 Lermontov St., Irkutsk 664074</p></bio><email xlink:type="simple">saw@istu.edu</email><xref ref-type="aff" rid="aff-1"/></contrib></contrib-group><aff-alternatives id="aff-1"><aff xml:lang="ru"><institution>Иркутский национальный исследовательский технический университет</institution><country>Россия</country></aff><aff xml:lang="en"><institution>Irkutsk National Research Technical University</institution><country>Russian Federation</country></aff></aff-alternatives><pub-date pub-type="collection"><year>2025</year></pub-date><pub-date pub-type="epub"><day>03</day><month>01</month><year>2026</year></pub-date><volume>29</volume><issue>4</issue><fpage>453</fpage><lpage>465</lpage><permissions><copyright-statement>Copyright &amp;#x00A9; Корж М.А., Перелыгина А.Ю., Савилов А.В., 2025</copyright-statement><copyright-year>2025</copyright-year><copyright-holder xml:lang="ru">Корж М.А., Перелыгина А.Ю., Савилов А.В.</copyright-holder><copyright-holder xml:lang="en">Korzh M.A., Perelygina A.Y., Savilov A.V.</copyright-holder><license xml:lang="ru" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>Данная работа распространяется под лицензией Creative Commons Attribution 4.0.</license-p></license><license xml:lang="en" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>This work is licensed under a Creative Commons Attribution 4.0 License.</license-p></license></permissions><self-uri xlink:href="https://ipolytech.elpub.ru/jour/article/view/986">https://ipolytech.elpub.ru/jour/article/view/986</self-uri><abstract><p>Цель – исследование влияния разрешения сетки сканирования на точность и время измерений деталей двойной кривизны. В качестве объекта исследования была выбрана типовая авиационная деталь «База люка», имеющая двойную кривизну и повторяющая внешние обводы самолета. Исследования проводились с применением портативного сканера Scantech KSCAN MagicI, позволяющего получать информацию о геометрии изделия без привязки к жесткой базе за счет использования позиционных меток. Сканер имеет линейную точность 0,020 мм, повторяемость 0,010 мм, объемную точность 0,015 мм + 0,030 мм/м – отклонение, которое накапливается с увеличением размера сканируемого объекта; разрешение 0,010 мм. Геометрический контроль детали выполнялся посредством измерений как на внешней, так и на внутренней поверхности. Анализ геометрии проводился на основе кривой, построенной вдоль поверхности детали и по заданным типовым элементам – центрам отверстий. Для построения указанных кривых определялись точки пересечения оси каждого отверстия с поверхностью детали как на контрольной модели, так и на полученном при сканировании изображении. Показано, что увеличение разрешения от 0,1 мм до 0,025 мм приводит к значительному увеличению времени сканирования, тем самым снижая производительность процесса контроля геометрии детали почти в 4 раза. При этом точность сканирования не повышается. Для повышения точности измерения на наиболее ответственных участках, таких как отверстия или зоны со сложной геометрией, рекомендуется применять комбинированный метод контроля – сканирование с локальным повышением разрешения на вогнутых и ответственных поверхностях. Установлено, что сканирование с разрешением сетки 0,1 мм является наиболее рациональным выбором для условий реального производства как обеспечивающее приемлемую точность при минимальных временных затратах. Внедрение подобных технологий позволит сократить продолжительность операций технического контроля, сохранив при этом требуемый уровень качества изготавливаемых деталей.</p></abstract><trans-abstract xml:lang="en"><p>This study examines the effects of scanning mesh resolution on the measurement accuracy and duration for parts with double curvature. The research employed a standard aircraft component, referred to as a hatch base. This component features a double curvature that conforms to the external contours of an airplane. Measurements were carried out using a portable Scantech KSCAN Magic scanner, which captures part geometry without a fixed datum using positional markers. This scanner has a linear accuracy of 0.020 mm, repeatability of 0.010 mm, volumetric accuracy of 0.015 mm + 0.030 mm/m, and resolution of 0.010 mm. Geometric inspection was performed on the external and internal surfaces of the part. The analysis involved a curve constructed along the part surface and specific datum features, namely, hole centers. For both the reference model and scanned data, the intersection points of each hole axis with the part surface were determined to construct these curves. The results demonstrate that an increase in resolution from 0.1 mm to 0.025 mm significantly extends the scanning time, thereby reducing the geometric inspection throughput by nearly a factor of four, without a corresponding improvement in accuracy. To enhance the measurement accuracy of critical features, such as holes or complex geometry zones, it is recommended to apply a combined inspection method involving scanning with locally increased resolution on concave and critical surfaces. The study established that a mesh resolution of 0.1 mm represents the most rational choice for real-world production environments, as it provides acceptable accuracy with minimal time investment. The implementation of such optimized scanning strategies can reduce the duration of quality control operations while maintaining the required quality standards for the manufactured parts.</p></trans-abstract><kwd-group xml:lang="ru"><kwd>фрезерование</kwd><kwd>сканирование</kwd><kwd>поверхность двойной кривизны</kwd><kwd>разрешение сетки</kwd><kwd>точность</kwd><kwd>контроль геометрии</kwd></kwd-group><kwd-group xml:lang="en"><kwd>milling</kwd><kwd>scanning</kwd><kwd>double-curvature surface</kwd><kwd>mesh resolution</kwd><kwd>accuracy</kwd><kwd>geometry inspection</kwd></kwd-group></article-meta></front><back><ref-list><title>References</title><ref id="cit1"><label>1</label><citation-alternatives><mixed-citation xml:lang="ru">Wang Xinfeng, Liu Qing, Jia Kun, Zhang Yan, Zhang Haiyin, Zhen Jia. Study of aircraft skin defect detection and characterization methods // IEEE 11th International Conference on Information, Communication and Networks (Xi’an, 17–20 August 2023). 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